Portable four-point probe resistivity tester

Portable resistance measurement instrument is used to measure the silicon wafers, the resistivity and diffusion layer, extension, ITO, conductive rubber alculates conductive materials such as small squares.

Resistance This instrument in accordance with semiconductor materials resistivity of international and national standard test method according to relevant provisions of the design. It mainly consists of electrical CeLiangBu (hosts) and four probe, when need but with test.