Electronic Circuit Comprehensive Experimental Kit
Specifications
- Origin
- China
Electronic Circuit Comprehensive Experimental Kit is a Other Electronic Components product. Key specs — Origin: China.
Product Description
I.
Product Features The experiment kit is tightly close to such courses syllabus as Analog Electronic Technology, Digital Electronic Technology, High-frequency Electronic Circuit and etc in colleges and universities, which could fully meet requirements of experimental teaching on electrical major’s electronic technology courses, and etc among colleges and universities.
(1) It includes three parts of experiments, analog circuit, digital circuit, and high-frequency, which adopts the design mode of adding main board and module, and there are 15 modules that could be chosen so as to facilitate laboratory’s configuration and upgrade.
(2) The real modularization design: experiment circuit’s silkscreen is printed on the front side of module while non-regulatory components are welded to the back side, and the plastic transparent cover for protection is installed to the outside, which is not only beautiful, but also convenient for users to observe circuit and components.
(3) The experiment kit integrates AC, DC power supply, digital signal source, low-frequency signal source and high-frequency signal, which only requires oscilloscope and multimeter to complete all experiments. (4) The content is abundant, which not only includes basic unit experiments, but also systematic experiments, such as FM transceiver and etc.
II. Performance Parameters (1) AC, DC Power Supply Input: AC 220V±10% Output: DC +5V/3A, +12V/1A, -12V/0.5A, -5V/0.5A, 2MHz~14MHz AC 7.5V, 15V
(2) High-frequency Signal Source Sine wave: 10.7MHz, Vp-p=50mV~1.5V FM wave: center frequency 10.7MHz
(3) Low-frequency Signal Source Output waveform: sine wave, square wave, triangular wave Frequency range: 10Hz~120Hz, 100Hz~1.8 KHz, 1 KHz~60 KHz, 50 KHz~4MHz Signal Amplitude: 2V Square wave duty ratio: 20%~80%
(4) Digital Signal Source Square wave: 4MHz, 2MHz, 1MHz, 500 KHz, 200 KHz, 100 KHz, 10 KHz, 1 KHz, 500 Hz, 100 Hz, 10 Hz, 1 Hz Two-channel single pulse: Positive, negative pulses, pulse width 0.2S
(5) Experiment Kit Host Specification: 43cm×31.5cm×12cm
III. Experiment Contents Analog Electronic Part
(1) Function signal generator experiment (differential amplifier module) (2) Differential amplifier experiment (differential amplifier module) (3) Transistor common-emitter mono-tube amplifier experiment (transistor module) (4) Transistor two-step amplifier experiment (transistor module) (5) Field effect tube amplifier experiment (transistor module) (6) Negative feedback amplifier experiment (transistor module) (7) Emitter follower experiment (transistor module) (8) RC sine wave oscillator experiment (transistor module) (9) LC sine wave oscillator experiment (transistor module) (10) DC stabilized voltage power experiment—transistor stabilized voltage power (stabilized voltage module) (11) DC stabilized voltage power experiment—integrated regulator (stabilized voltage module) (12) Thyristor controllable rectifier circuit experiment (stabilized voltage module) (13) Integrated operational amplifier index test experiment (operational amplifier module) (14) Integrated operational amplifier’s basic application experiment—analog operational circuit (operational amplifier module) (15) Integrated operational amplifier’s basic application experiment—waveform generator (operational amplifier module) (16) Integrated operational amplifier’s basic application experiment—active filter (operational amplifier module) (17) Integrated operational amplifier’s basic application experiment—voltage comparator (operational amplifier module) (18) Voltage—frequency conversion circuit experiment (operational amplifier module) (19) Comprehensive application experiment—waveform conversion circuit experiment (operational amplifier module, differential amplifier module) (20) Low-frequency power amplifier experiment—OTL power amplifier (power amplifier module) (21) Low-frequency power amplifier experiment—integrated power amplifier (power amplifier module)
Digital Electronic Part
(1) TTL gate circuit’s logic function and parameter test experiment (DIP expansion board module, auxiliary expansion board module) (2) Encoder and data selector experiment (DIP expansion board module, auxiliary expansion board module) (3) Combinational logic circuit’s design and text experiment (DIP expansion board module, auxiliary expansion board module) (4) Trigger R-S, J-K, T, D experiment (DIP expansion board module, auxiliary expansion board module) (5) Led display experiment (DIP expansion board module, auxiliary expansion board module) (6) Integrated counter experiment (DIP expansion board module, auxiliary expansion board module) (7) Waveform generation experiment (DIP expansion board module, auxiliary expansion board module) (8) 555 timer and its application (DIP expansion board module, auxiliary expansion board module) (9) D/A conversion experiment (A/D & D/A module) (10) A/D conversion experiment (A/D & D/A module) (11) Basic gate circuit and software application experiment (7128 adaptation board module) (12) Competition and risk experiment realization with software (7128 adaptation board module) (13) Combinational logic circuit experiment realization with software (7128 adaptation board module) (14) Trigger function experiment realization with software (7128 adaptation board module) (15) Counter experiment realization with software (7128 adaptation board module) (16) CMOS gate circuit’s logic function and parameter test experiment (DIP expansion board module, auxiliary expansion board module) (optional) (17) TTL collector open-circuit and three-state output gate test experiment (DIP expansion board module, auxiliary expansion board module) (optional) (18) Integrated logic circuit’s connection and drive experiment (DIP expansion board module, auxiliary expansion board module) (optional) (19) Adder and numeric comparator experiment (DIP expansion board module, auxiliary expansion board module) (optional) (20) Competition and risk experiment (DIP expansion board module, auxiliary expansion board module) (optional) (21) Shift register and its application experiment (DIP expansion board module, auxiliary expansion board module) (optional) (22) Counter MSI chip application experiment (DIP expansion board module, auxiliary expansion board module) (optional) (23) Pulse distributor and its application experiment (DIP expansion board module, auxiliary expansion board module) (optional) (24) Schmidt trigger and its application experiment (DIP expansion board module, auxiliary expansion board module) (optional) (25) Mono-stable trigger and its application experiment (DIP expansion board module, auxiliary expansion board module) (optional)
High Frequency Part
(1) High-frequency small signal tuned amplifier experiment (receiving module) (2) Design of frequency modulation receiver experiment (receiving module) (3) Ring mixer experiment (ring mixer module) (4) Sine wave oscillator experiment (ring mixer module) (5) Experiment of collector amplitude modulation and large signal detection (collector amplitude modulation and large signal detection module) (6) Experiment of high-frequency resonance power amplifier experiment (transmitter module) (7) Experiment of varactor diode frequency modulation (transmitter module) (8) Design of small power frequency modulation transmitter (transmitter module) (9) Analog phased-locked loop application experiment ( PLL double frequency, PLL demodulation) (phased-locked loop application module) (10) Application experiment of integrated circuit analog multiplier (mixing, detection, balanced amplitude modulation, frequency discrimination) (multiplier module)
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