Dynamic nanometer particle size analyzer
Listing ID#171187
ModelWinner802
CategoryLab Supplies

Dynamic nanometer particle size analyzer

Specifications

Brand
Winner
Origin
China
Certifications
CE and ISO9001:2009
MOQ
1 set
Packaging
Wooden box
Price Term
EXW/EX-Work,FOB
Payment Term
T/T,L/C,Western Union
Supply Ability
300 sets per month
Delivery Time
3-5 workdays after payment receipt
Loading Ports
Hongkong
Guarantee
2 years
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Quick answer

Dynamic nanometer particle size analyzer is a Lab Supplies product. Key specs — Brand: Winner; Origin: China; Certifications: CE and ISO9001:2009; MOQ: 1 set.

Product Description

Main Features:

1) Advanced test principle: Dynamic light scattering principle and photon correlation spectrum technology, according to Brownian motion speed of particle to test particle size, different size of particles have different speed, when laser illuminate these particles, it will make scattering light happen different speed of fluctuations- downs.

Photo correlation spectrum method will analyze these particle size according to Photon fluctuations -downs in particular direction.

2) High resolution: Using PCR technology test nanometer-scale particle size, must be able to distinguish nanosecond signal fluctuations. The core components of the instrument is CR256 digital correlator developed by our company, with 8ns high resolution speed.

3) High sensitivity and Noise-signal ratio Detector is composed of imported HAMAMATSU photomultiplier, so ensure good accuracy.

4) High speed data collection and calculation Self-developed patent product-CR256 digital correlation, It could finish dynamic scattering light intensity collection and autocorrelative function real time calculation, Data processing speed is up to 162M, effectively reflect dynamic scattering light information of different sizes of particles.

5)High stable light system Photon correlation spectrum detect system adopt optical-fibre technology, smaller size and high anti-interference and reliability.

6)High precision constant temperature control system Semiconductor temperature control technology, precision control within ±0.2℃,make samples be in a constant state throughout the testing process, prevent testing error because temperature change will change liquid viscosity and Brownian movement speed.

7) Output parameters: freely set D10-D100, D[4,3],D[3,2], D[2,1],D[1,0] and specific surface area.

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